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X-Ray Fluorescence Spectrometer(XRF)

X-ray fluorescence spectrometer(XRF) is a fast, non-destructive material measurement method, mainly used to provide chemical, elemental and trace element analysis, have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium. It is widely used in elemental analysis and chemical analysis, especially in the investigation and research of metals, glass, ceramics and building materials, geochemistry, forensics, archeology and artworks, such as oil paintings and murals. Compared to other analytical techniques XRF requires no or very little sample preparation, and it’s low-cost.
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